MiNT Systems Corporation






Home News Product Lines Synasys™ Mixed Signal Test System Synasys™ Mixed Signal Waveform Analyzer Synasys™ Automatic Open/Short Tester Flash Device Test System High Speed Flash Memory Programming System Omega Mixed Signal Test System Lithium/Fuel Cell Test System Lithium Battery Test System Test Solutions Ordering Information Support Product Registration Downloads Sales & Licensing Worldwide Sales Representatives Technology Licensing About MiNT Contact Us Careers at MiNT		Flash Device Test System (FDTS) MS7208 San Jose, California (October 3, 2008) - MiNT Systems Corporation, a technology-driven ATE instrument company, introduced today the expandable MS7208 Flash Device Test System (FDTS) customizable to users' flash memory or device manufacturing needs. Expandable Mixed Signal Waveform Analyzer MS8321 San Jose, California (October 3, 2007) - MiNT Systems Corporation, a technology-driven ATE instrument company, introduced today the expandable Mixed Signal Waveform Analyzer MS8321 as a new addition to the Synasys™ product family. Synasys™ Mixed Signal Test System San Jose, California (September 20, 2007) - MiNT Systems Corporation, a technology driven ATE instrument company, today introduced an innovative product, the Synasys™ mixed signal scope test system.