MiNT Systems Corporation






Home News Product Lines Synasys™ Mixed Signal Test System Synasys™ Mixed Signal Waveform Analyzer Synasys™ Automatic Open/Short Tester Flash Device Test System High Speed Flash Memory Programming System Omega Mixed Signal Test System Lithium/Fuel Cell Test System Lithium Battery Test System Test Solutions Ordering Information Support Product Registration Downloads Sales & Licensing Worldwide Sales Representatives Technology Licensing About MiNT Contact Us Careers at MiNT		Note: Adobe Acrobat Reader is required to view PDF files. You may download the program from Adobe for free. San Jose, California (October 3, 2008) - MiNT Systems introduces the expandable MS7208 Flash Device Test System (FDTS) customizable to users' flash memory or device manufacturing needs. San Jose, California (October 3, 2007) - MiNT Systems introduces a flexible mixed signal waveform analyzer adaptable to users' waveform capture and generation needs. San Jose, California (September 20, 2007) - MiNT Systems Corporation introduces a low cost color 300MHz digital osclloscope module (DSO Module, MS8110) for the Synasys™ Mixed Signal Test System Model MiNT8300. San Jose, California (September 20, 2007) - MiNT Systems Corporation introduces a low cost color 16 channel logic analyzer module (LA Module, MS8120) for the Synasys™ Mixed Signal Test System Model MiNT8300. San Jose, California (September 20, 2007) - MiNT Systems Corporation introduces a low cost versatile modular mixed signal test system.